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Frontal Control concept
The MX51 uses the original Frontal Control design concept of the MX-series, with focusing knobs, illumination intensity controls, and a stage control panel all arranged in front for easy access. Operator fatigue is significantly reduced by positioning the most frequently used knobs and switches in this manner. Since electronics components inspection generally involves frequent stage manipulation, controls are located near the optical axis for maximum operator convenience. |
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Flexible reflected light illumination options
The illumination options accommodate virtually any application. This boosts operational efficiency and cost-effective performance in routine inspection of electronics components. The standard illuminator (BX-RLA2) complies with near IR observation, as well as offering brightfield, darkfield, Nomarski DIC and simple polarising observations. A universal illuminator (BX-URA2) is also available for fluorescence observation. |
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Transmitted light observation
The combination of a transmitted illumination unit with the 150mm stage enables transmitted light brightfield observation useful for observations of samples such as MEMS (Micro Electronics Mechanical Systems) sensors and other optical/optronic components. |
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Detachable arm for large samples
In order to accommodate bulky samples and provide adequate working distance, the MX51 allows detachment of the arm and insertion of an intermediate attachment between the arm and the frame. |
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Clear and sharp images with UIS optics
Fast, accurate detection of defects, and hence fewer check failures, are ensured by the MX51's enhanced brightfield/darkfield observation capabilities, which deliver approximately 4* times greater detection sensitivity than previous models. Outstanding accuracy in observation of small diameter wafers such as those used in today's smaller sensors and many other high performance electronic devices.
*Using the recommended set of objective lenses. |
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Motorised revolving nosepiece
The motorised revolving nosepiece enables direct exchange of objectives for higher efficiency. In addition to the standard nosepiece, the MX51 can
be equipped with a range of motorised nosepieces. An external handset allows direct selection of the desired objective. The MX51 also offers a centerable, motorised nosepiece for accurate positioning for easy observation at high magnifications. |
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Confocal module for high-resolution, high-contrast observations.
The confocal module (U-CFU) employs an original disk scanning method to deliver high-contrast, high-resolution observation images. This allows inspection of multi-layered electronic devices. |
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Flexible and versatile
