Specifications for a4i MatIA

Determination of phase fractions in
    multi-phased structures
Determination of particle size and
    particle fractions
Intercept grain sizes measurement
Planimetric grain size measurement
Measurement of coating thickness
Interactive determination of mean
    dendrite arm spacing
Evaluation of graphite in cast iron
Analysis of banded or oriented
    structures
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Key FeaturesSpecifications

a4i PhaseFraction
  • Determination of phase fractions in multi-phased structures
  • Analysis of up to six phases simultaneously
  • Measurement area can be the entire image or any selected area
  • Definition of several threshold values for the detection and measurement of multi-phases
a4i ParticleSize
  • Measurement of any objects: pores, impurities, shrink voids, etc.
  • Measurement area can be the entire image or any selected area
  • Automatic separation of adjoining objects
  • Determination of particle fractions and size distribution
a4i GrainSize
  • Determination of grain sizes in single-phased, ferritic and dual-phased, ferritic-pearlitic structures according to ASTM E112 or DIN 50601
  • Other grain structures can be analysed as well
  • Automatic grain boundary reconstruction via elimination of inclusions and artifacts
  • Automatic measurement using the line intercept method with interactive correction capability
  • Determination of ASTM grain size, lineal grain size and distribution of these characteristics
  • Calculation of anisotropy
  • Determination of secondary phase in multi-phased structures
a4i GrainArea
  • Automatic reconstruction of grain boundaries via elimination of inclusions and pores in grains
  • Planimetric determination of grain sizes (area measurement) with possible interactive corrections
  • Determination of grain sizes according to ASTM E112 standard specifications
  • Applicable for single-phased ferritic or dual-phased ferritic pearlitic structures
  • Characteristic values detected are:
        • grain size number (according to ASTM)
        • number of grains per area unit
        • average grain diameter
        • average grain area
        • axis ratio of the grains
        • distribution of area
a4i CoatingThickness
  • Interactive measurement of single- and multi-layered coatings by indicating coating boundaries via mouse
  • Measurement along equidistant, horizontal or vertical test lines
  • Porosity and other objects do not affect measurement results
  • Determination of mean coating thickness and histogram of coating
    thickness distribution
a4i DAS
  • Determination of mean dendrite arm spacing in cast aluminum at manually drawn lines, parallel to the main arm
  • Optional, automatic detection of dendrite arms
a4i CastIron Expert
  • Automatic classification according to the EN ISO 945 and ASTM A 247-67 standards
  • Determination of required parameters: shape, alignment and size in a single processing step
  • Determination of:
        • graphite size (recommended value of 1-8)
        • graphite shape (classes I - VII)
        • graphite alignment (classes A - E)
  • Classification of flake alignment via teachable classificator
  • Other additional measurement parameters:
        • measuring graphite fraction
        • determination of nodularity
        • ferrite-pearlite determination using etched specimens
        • display of microstructural formation (at greater magnification)
  • Results displayed immediately
  • Generate reports
a4i Banding
  • Carbide banding of steel within a tempered martensite or bainitic matrix
  • Investigation of steel with no matrix phase but austenite and ferrite
  • Banded pearlite in a banded ferrite matrix
  • Bainite in a banded ferrite matrix
  • Delta ferrite in non-oriented martensitic matrix
  • Investigation of α/β-Brass
a4i ImageSource
  • Control software for digital and analog cameras
  • Image acquisition from digital and analog cameras at the touch of a button
  • Live image with focus indicator integrated into the application‘s user interface
  • Control of all camera parameters (brightness, contrast, exposure, etc.)
  • Automatic histogram optimisation and white balance
  • Profiles for multiple camera settings can be saved
  • Application of filters and optimisation functions during image acquisition (e.g., sharpness filter, image integration, etc.)
  • Integrated management system for calibration values, copy calibration values into archive




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